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Copy file name to clipboardExpand all lines: testimonials.bib
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year = {2024}
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@article{Robertson2023,
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abstract = {Cosolvents play an integral role in polymer solubility, with myriad applications in drug delivery and energy storage. In particular, dimethyl sulfoxide (DMSO) has received substantial attention to date due to its cryoprotective properties and interesting nonideal mixing behaviour. Here, for the first time, we probe the fundamentals of DMSO–water solvent structuring using a thermoresponsive poly(N-isopropoylacrylamide) (PNIPAM) brush as an exemplar. Spectroscopic ellipsometry and neutron reflectometry were employed to monitor changes in brush swelling and conformation as a function of temperature and solvent composition, whereby changes in solvent structure can be deduced. Importantly, unlike free polymer, grafted polymers permit measurements across the entire solvent composition space, including ‘poor' solvent conditions, permitting the characterisation of polymers in complex media for future technologies. In the water-rich regime, the prevalent hydrogen-bond network resulted in the PNIPAM brush exhibiting a lower critical solution temperature (LCST) up to DMSO mole fractions of 0.10 (xD = 0.10), which decreased with increasing xD; DMSO is a chaotropic cosolvent. This region was adjacent to a cononsolvency region. Interestingly, reentrant swelling was observed for above approximately xD = 0.2. In DMSO-rich regimes, non-site-specific dipole–dipole interactions resulted in the PNIPAM brush exhibiting an uppercritical solution temperature (UCST), whereby the periphery of the swollen brush was more diffuse than at low xD. At all temperatures, pure DMSO is a good solvent for PNIPAM and no thermoresponse was observed. Herein we demonstrate how the structure and swelling of a polymer brush film can be modulated by tuning solvent composition by mixing two ‘good' solvents.},
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author = {Robertson, Hayden and Nelson, Andrew R J and Prescott, Stuart W and Webber, Grant B and Wanless, Erica J},
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year = {2023}
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@article{ROBERTSON2024103238,
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title = {Illuminating the nanostructure of diffuse interfaces: Recent advances and future directions in reflectometry techniques},
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journal = {Advances in Colloid and Interface Science},
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pages = {103238},
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year = {2024},
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issn = {0001-8686},
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doi = {https://doi.org/10.1016/j.cis.2024.103238},
abstract = {Diffuse soft matter interfaces take many forms, from end-tethered polymer brushes or adsorbed surfactants to self-assembled layers of lipids. These interfaces play crucial roles across a multitude of fields, including materials science, biophysics, and nanotechnology. Understanding the nanostructure and properties of these interfaces is fundamental for optimising their performance and designing novel functional materials. In recent years, reflectometry techniques, in particular neutron reflectometry, have emerged as powerful tools for elucidating the intricate nanostructure of soft matter interfaces with remarkable precision and depth. This review provides an overview of selected recent developments in reflectometry and their applications for illuminating the nanostructure of diffuse interfaces. We explore various principles and methods of neutron and X-ray reflectometry, as well as ellipsometry, and discuss advances in their experimental setups and data analysis approaches. Improvements to experimental neutron reflectometry methods have enabled greater time resolution in kinetic measurements and elucidation of diffuse structure under shear or confinement, while innovation in analysis protocols has significantly reduced data processing times, facilitated co-refinement of reflectometry data from multiple instruments and provided greater-than-ever confidence in proposed structural models. Furthermore, we highlight some significant research findings enabled by these techniques, revealing the organisation, dynamics, and interfacial phenomena at the nanoscale. We also discuss future directions and potential advancements in reflectometry techniques. By shedding light on the nanostructure of diffuse interfaces, reflectometry techniques enable the rational design and tailoring of interfaces with enhanced properties and functionalities.}
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